Configure a Tektronix DSA8200 TDR/Sampling System Failure Analysis
Interconnect Impedance Testing
Interconnect S-parameter Analysis
Measured Based SPICE Model Development
Configure the DSA8200 TDR/Sampling system that best fits your application. For your benefit you can:
1)Review the product descriptions below on this web page
2)Follow the quick links for each of these system components to the Tektronix web site for up-to-date product information (Data sheets, videos and more) .
3)Send an email to a Tektronix Product specialist to answer additional configuration questions and request a quote for a total system solution specific to solve your measurement application.
Send an e-mail request for system configuration support or price quotation to a Tektronix Specialist below:
Complete Tektronix TDR/TDT Interconnect DVT Analysis system. Components included in this picture: DSA8200, 80E10 50Ghz TDR/Sampling module, PPM100 Articulating Arm, IConnect Signal Integrity Software and an External Display Monitor for Viewing software separate from TDR Scope display, DVT30-1MM GigaProbes™ for 100 or 50 ohm TDR probing.
Tektronix DSA8200 Mainframe
DSA8200 Digital Serial Analyzer Sampling Oscilloscope Features & Benefits State of the Art Sampling Oscilloscope for Communication Signal Analysis, TDR/TDT/Serial Data Network Analysis, Acquisition and Measurements of Repetitive Ultrafast Signals Acquisition of Spread Spectrum Clocking (SSC) signals Industry’s Only Mainframe to Support up to 8 Input Channels for Increased Flexibility and Throughput Four Color Graded, Variable Persistence Waveform Databases Measurement System with Over 100 Automated Measurements Complete Suite of Communications Measurements Includes Both Types of OMA, SSC Profile, and Many Others Automated ITU/ANSI/IEEE Mask Testing Masks and Measurements for SONET/SDH, FC, Ethernet and Other Standards Built-in Mask Updates Can be Loaded from Factory-Supplied File Mask Margin Testing for Guard Banding Production Testing Acquisition Modules Fully Integrated Multi-rate Optical Modules Optical Modules up to 80+GHz 80C10B*1 High Accuracy "ER Calibrated" Measurement Available in Some Modules Electrical Modules to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%) Flexible Rate Clock Recovery Clock Recovery with SSC (Spread Spectrum Clocking) Support Available Jitter, Noise, BER and Serial Data Link Analysis Measures and Separates Deterministic Data Dependent Jitter from Random Jitter Measures Vertical Noise Separating Deterministic Data Dependent Noise from Random Noise Highly Accurate BER and Eye Contour Estimation, Support for Latest Measurements - DDPWS, TWDP FFE/DFE Equalization, Transmitter Equalization Channel Emulation for channels with >30 dB of loss Linear Filter for Fixture De-embedding, Linear Filtering
TDR (Time Domain Reflectometry)| Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and 12 ps Incident Rise Time Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μVRMS at 50 GHz, Independent Sampler Deskew Ensures Easy Fixture and Probe De-embedding, Industry’s Only Mainframe to Accommodate up to Four True Differential TDR or Electrical Channel Pairs for Increased System Versatility S-parameters Measurements Up to 50 GHz Differential, Single Ended, Mixed-Mode; Insertion, Return Loss, Frequency Domain Crosstalk PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests Intuitive, Easy and Accurate for Serial Data, Gigabit Digital Design and Signal Integrity Fast and Accurate Automated Multi-port S-parameter Measurements with Command Line Interface Industry’s Best Standard Timebase Jitter Performance, 800 fsRMS Industry Leading Timebase Jitter Performance, <200 fsRMS*2 Available with Phase Reference Mode Fast Acquisition Rate and High Throughput True Differential Remote Sampler Enabling Placement Near DUT for Superior Signal Fidelity FrameScan™ Acquisition Mode with Eye Diagram Averaging: Isolate Data Dependent Faults Examine Low-power Signals MS Windows XP Operating System Advanced Connectivity to 3rd party Software
Tektronix TDR and Sampling Modlues
Electrical Sampling Modules 80E10 • 80E09 • 80E08 • 80E07 • 80E06 • 80E06X2 • 80E04 • 80E03 • 80E01 Features & Benefits All Modules Up to 70 GHz Bandwidth and 5 ps Measured Rise Time (10 - 90%) Lowest Noise for Analysis – 450 μVRMS at 60 GHz, 300 μVRMS at 30 GHz Remote Samplers*1 Enable Location of Sampler Near DUT and Ensure Best Signal Fidelity Independent Sampler Deskew Ensures Easy Fixture and Probe De-embedding Dual Channel (Except 80E01 and 80E06) Precision Microwave Connectors (3.5 mm, 2.92 mm, 2.4 mm and 1.85 mm)
IConnect® and MeasureXtractor™ Signal Integrity TDR and S-parameter Software
IConnect® and MeasureXtractor™ Signal Integrity TDR and S-parameter Software
80SICMX • 80SICON • 80SSPAR
Features & Benefits
Easily Analyze Sources of Interconnect Jitter, Losses, Crosstalk, Reflections, and Ringing Analyze Interconnects Concurrently in Time and Frequency Domains Quickly Perform Interconnect Link Analysis and Ensure System Level Simulation Accuracy Efficiently Model PCBs, Flexboards, Connectors, Cables, Packages, and Sockets Topological and Behavioral, Measurement Based, Frequency Dependent, Exact SPICE Models Automatically Convert TDR/T or VNA Data into SPICE with MeasureXtractor; Model Passivity, Stability, Causality Guaranteed Quickly Obtain S-parameters Using Your TDR Oscilloscope Differential, Single Ended, Mixed-Mode; Insertion, Return Loss, Frequency Domain Crosstalk PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing and Standard Compliance Testing Including Eye Mask Tests Simplified Calibration Procedure Minimizes Human Errors and Makes Fixture De-Embedding a Simple Task Intuitive, Easy and Accurate for Serial Data, Gigabit Digital Design and Signal Integrity Obtain More Accurate Impedance Measurements Enhanced TDR Resolution Fast and Easy Package and PCB Trace Failure Location 50 Ω Calibration Eliminates the Need for Time Consuming Normalization Automate your manufacturing test and R&D measurements with scripts and programmatic control Command line interface for many functions (S-parameters, Z-Line, others) Optimized for use with DSA8200 Digital Serial Analyzer sampling oscilloscope with 80E10, 80E08 and 80E04 true differential TDR modules
PPM100 Articulating Arm
PPM203B
The PPM203B has a three axis arm system.
It is a general-purpose benchtop probing aid
designed to be used when probing PC boards,
hybrids and MCMs that employ fine-pitch
devices and interconnects.
The PPM203B incorporates a weighted base
that makes it well-suited to probing fine pitches
in benchtop applications.
PPM100
The PPM100 is a low cost probing aid
designed to provide quick and easy access to
PC boards, hybrid circuitry and many other
devices that require hands-free probing. The
PPM100 has a flexible “gooseneck” arm
allowing multiple adjustment positions. Once
positioned the course adjust knobs lock the
probe holder into position. A fine adjustment
control at the arm head allows further pressure
adjustment after the probe is initially
positioned. The spring compliance incorporated
into the probe head holder keeps pressure
on the probe to circuit, maintaining a
superior connection to the device under test.
The PPM100 includes both a weighted base
for desktop applications and a C-clamp base
for attaching to chassis or rack applications.
PPM100 Connected Directly to GiaProbes for Low Loss TDR Performance
